To meet the diverse global demand for high-precision imaging inspection, OPTICKS Taiwan has integrated OPT SCAN 1, OPT SCAN 2, and NED CIS Line Scan systems, offering a variety of specifications and configurations. This enables customers to flexibly select the most suitable system based on their application scenarios and precision requirements.
This article summarizes key specifications including Resolution, Working Distance (WD), Depth of Field (DOF), Supported Length, Interface (I/F), and Illumination Design, helping users intuitively understand the technical differences among the brands.
📊 Key Specifications Comparison
| Specification | OPT SCAN 1 | OPT SCAN 2 | NED |
|---|---|---|---|
| Resolution | 300 / 600 / 1200 / 2400 / 4800 DPI | 300 / 600 / 900 / 1200 / 1800 / 3600 DPI | 300 / 600 / 1200 DPI |
| WD | 8mm, 15mm | 7mm, 15mm, 30mm | 17mm, 50mm, 60mm |
| DOF | ±0.6mm, ±0.9mm | ±1.3mm | ±1mm, ±5mm, ±10mm |
| Length | 290mm–1500mm | 165mm–1,937mm | 300mm–1,523mm |
| I/F | CameraLink Medium / CameraLink DECA / CoaXPress | 10GigE | CameraLink / CoaXPress |
| Illumination | Built-in (angle configurable) | Built-in (angle adjustable) | External (angle adjustable) |
📌 Brand Highlights & Application Focus
OPT SCAN 1
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Offers multiple working distances (8mm, 15mm) and interface options (CameraLink, CoaXPress, etc.).
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Maximum resolution up to 4800 DPI, combining flexibility and integration.
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Ideal for automated equipment integration and multi-purpose inspection.
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Built-in dual-side illumination saves space; one model has a total height of only 91mm (WD 15mm, side cable exit), making it perfect for tight-space applications.
OPT SCAN 2
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Supports up to 3600 DPI resolution and features a high-speed 10GigE interface.
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Suitable for high-speed production lines requiring large data transfer.
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Compact adjustable external light provides flexibility for varying product conditions.
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User-friendly calibration reduces learning curve significantly.
NED
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Emphasizes stability and high-precision imaging, ideal for precision metrology and semiconductor inspection.
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Key features: high DOF (±1mm–±10mm) and long WD (17mm–60mm), supporting applications requiring long working distances and accommodating tilted camera setups.
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External light source can be adjusted for material-specific illumination and co-axial lighting options.
🔍 Technical Analysis of CIS Specifications
1️⃣ Resolution & Application Targeting
OPT SCAN 1 – Ultra-high Precision (4800 DPI)
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Higher DPI means denser pixels per unit scan width and the ability to detect smaller defects.
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Targets zero-defect industries such as advanced panels and semiconductor wafers.
OPT SCAN 2 – High Efficiency & Mainstream (3600 DPI)
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Balances high resolution and cost efficiency, suitable for PCB, lithium battery films, and other high-volume, high-precision applications.
NED – Proprietary High-Resolution Lens (300 / 600 / 1200 DPI)
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Custom-designed CIS lens emphasizes high resolving power, matching the camera’s optimal resolution.
2️⃣ Optical Characteristics & Environmental Adaptability (WD & DOF)
OPT SCAN 1 / OPT SCAN 2 – Ultra-short Working Distances (7–15mm WD)
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Typical CIS advantage: minimizes ambient light interference and ensures 1:1 imaging.
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Extremely sensitive pixels ideal for flat, high-speed, high-precision inspections.
OPT SCAN 2 – Medium DOF (±1.3mm)
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Balances precision and tolerance, suitable for materials with slight curvature or thickness variations.
NED – Maximum DOF & WD (±1–10mm, 17–60mm)
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Ensures clear imaging on products with varying thickness, e.g., DIP components on PCBs.
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High DOF and WD provide optimal conditions for tilted camera setups.
3️⃣ Data Transmission & Interface Optimization
High-resolution CIS generates massive data; interface design is critical:
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OPT SCAN 1 / NED：CameraLink DECA / CoaXPress → high bandwidth, low latency for ultra-high resolution data transfer.
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OPT SCAN 2：10GigE → reduces cabling and integration costs, ideal for factory networks or long-distance transmission.
4️⃣ Module Size & Illumination Configuration
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OPT SCAN 2： Maximum scan length of 1,937mm → suitable for wide-format applications such as large glass substrates and roll-to-roll printing.
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Illumination strategy： OPT SCAN 1 & 2 use built-in light for easy integration and calibration; NED uses external light for custom wavelengths or material-specific lighting.
🧩 CIS Technical Positioning by Brand
| Brand | Core Value | Typical Application |
|---|---|---|
| OPT SCAN 1 | Extreme precision & compact size | Advanced panels, semiconductor wafer & packaging retrofitting inspection |
| OPT SCAN 2 | Cost-effective & broad coverage | Semiconductor wafers, PCB inspection, wide roll-to-roll scanning |
| NED | Maximum DOF & working distance | 3D stacked semiconductor inspection, final PCB inspection |
🚀 OPTICKS Continues to Drive High-Precision Imaging Technology
OPTICKS has long been committed to the integration of optical imaging and inspection technologies, working closely with international suppliers and R&D partners. We continue to enhance modularity and performance, helping industries achieve smarter, more precise inspection and automation.
For any inquiries regarding our equipment or CIS systems, feel free to contact us:
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Service Hours: Mon–Fri, 09:00–18:00
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Phone: +886 2 2219 2669
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