allPIXA evo 32K CXP Mono Y Line Scan Camera

The Allied Vision allPIXA evo 32K line scan camera (Mono Y), with its innovative dual 16K sensor lines and real-time algorithms, delivers outstanding 32K images, making it especially suitable for sub-pixel defect detection in semiconductor, PCB, and AOI applications.

FEATURES

• Frame and line trigger options including variable
• encoder input
• DSNU and PRNU correction
• Continuous and automatic white balancing
• Precise multi-camera synchronization
• SDK and graphical tool for Windows and Linux
• Fully GenICam and GigE Vision compliant

PRODUCT ADVANTAGES

• With 10 µm optical resolution, scan 12-inch wafers — an effective alternative to the dual-16K image processing issue.
• Seamless replacement for 16K 20 µm models — no need to modify the lens; camera height and working distance remain unchanged.
• Ultra-high speed: CXP-12 at 73 kHz, enabling scanning speeds up to 730 mm/sec.
• Compared with multi-line TDI cameras: can be installed at an angle, without the resolution degradation caused by Multi-TDI.

SPECIFICATIONS

HARDWARE PRINCIPLE

Using 2-Line Pixel Shift technology and the camera’s built-in FPGA for real-time hardware computation, it achieves ultra-high-resolution sub-pixel 32K images.

APPLICATION EXAMPLE

DRAWINGS              

PRODUCT DEMO VIDEO

SPECTRAL SENSITIVITY